Semiconductor assemblies, stacked semiconductor devices, and methods of manufacturing semiconductor assemblies and stacked semiconductor devices

ABSTRACT

Stacked semiconductor devices, semiconductor assemblies, methods of manufacturing stacked semiconductor devices, and methods of manufacturing semiconductor assemblies. One embodiment of a semiconductor assembly comprises a thinned semiconductor wafer having an active side releasably attached to a temporary carrier, a back side, and a plurality of first dies at the active side. The individual first dies have an integrated circuit, first through die interconnects electrically connected to the integrated circuit, and interconnect contacts exposed at the back side of the wafer. The assembly further includes a plurality of separate second dies attached to corresponding first dies on a front side, wherein the individual second dies have integrated circuits, through die interconnects electrically connected to the integrated circuits and contact points at a back side, and wherein the individual second dies have a thickness of approximately less than 100 microns.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. application Ser. No.13/749,521 filed Jan. 24, 2013, now U.S. Pat. No. 8,994,163, which is adivisional of U.S. application Ser. No. 11/764,066 filed Jun. 15, 2007,now U.S. Pat. No. 8,367,471, each of which is incorporated herein byreference in its entirety.

TECHNICAL FIELD

The present invention is related to stacked semiconductor devices andmethods for manufacturing stacked semiconductor devices.

BACKGROUND

Packaged semiconductor devices are utilized in cellular phones, pagers,personal digital assistants, computers and many other types of consumeror industrial electronic products. Microelectronics manufacturers aredeveloping more sophisticated devices in smaller sizes. To meet currentdesign criteria, semiconductor components have increasingly dense arraysof input/output terminals within decreasing “footprints” on printedcircuit boards (i.e. the height and surface area the device occupies ona printed circuit board).

Semiconductor devices are typically fabricated on semiconductor wafersor other types of workpieces using methods that simultaneously process alarge number of dies (i.e., chips). Microelectronic devices generallyhave a die that includes an integrated circuit having a high density ofvery small components. The dies typically include an array of bond-padsor other external electrical terminals for transmitting supply voltage,signals, etc. to and from the integrated circuitry. The bond-pads areusually very small and are assembled in dense arrays having fine pitchesbetween bond-pads.

One technique to increase the density of microelectronic devices withina given footprint is stacking one microelectronic die on top of another.Through-substrate interconnects, for example, can electrically connectbond pads at a front side of a lower die with contacts at a back side ofthe lower die such that bond pads of a top die can be electricallycoupled to the back side contacts of the lower die. An existing processfor stacking such dies includes thinning first and second wafers byremoving material from the back side of the wafers to (1) exposeinterconnect contact points on the back side of the dies, and (2) reducethe thickness of the dies. The second wafer is generally thinned to notless than 300 microns. After thinning, the second wafer is singulated(i.e., cut) and separate dies from the second wafer are stacked ontodies on the first wafer. An encapsulant is subsequently disposed betweenindividual second dies, and the first wafer and encapsulant are cut toseparate stacked devices.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a cross-sectional view schematically illustrating stackedsemiconductor devices in accordance with an embodiment of the invention.

FIGS. 2A-2F are cross-sectional views schematically illustrating stagesof a method for manufacturing semiconductor assemblies.

FIG. 3 is a cross-sectional view of a portion of a stacked device asshown in FIG. 2F illustrating three stacked microelectronic dies.

FIG. 4 is a flow chart illustrating a method for manufacturing stackeddie semiconductor assemblies.

FIG. 5 is a flow chart illustrating another method for manufacturingstacked die semiconductor assemblies.

FIG. 6 is a schematic view of a system that incorporates stackedsemiconductor devices.

DETAILED DESCRIPTION

Specific details of several embodiments of the disclosure are describedbelow with reference to semiconductor assemblies, stacked semiconductordevices, methods of manufacturing semiconductor assemblies, and methodsof forming stacked semiconductor devices. The devices are manufacturedon semiconductor wafers that can include substrates upon which and/or inwhich microelectronic devices, micromechanical devices, data storageelements, optics, read/write components, and other features arefabricated. For example, SRAM, DRAM (e.g., DDR/SDRAM), flash memory(e.g., NAND/memory), processors, imagers, and other types of devices canbe constructed on semiconductor wafers. Although many of the embodimentsare described below with respect to semiconductor wafers, other types ofdevices manufactured on other types of substrates (e.g., dielectric orconductive substrates) may be within the scope of the invention.Moreover, several other embodiments of the invention can have differentconfigurations, components, or procedures than those described below inthis section. A person of ordinary skill in the art, therefore, willaccordingly understand that other embodiments of the invention may haveadditional elements, or still more embodiments may not have several ofthe features and elements shown and described below with reference toFIGS. 1-6.

FIG. 1 is a cross-sectional view that schematically illustrates asemiconductor assembly 100. In this embodiment, the semiconductorassembly 100 includes a semiconductor wafer 110 having a plurality offirst microelectronic dies 120 (identified individually by referencenumbers 120 a and 120 b), a temporary carrier 130 releasably attached toan active side 112 of the wafer 110, and a plurality of singulatedsecond microelectronic dies 140 (identified individually by referencenumbers 140 a and 140 b). Individual second dies 140 a and 140 b areattached to a back side 114 of the wafer 110 in a die patterncorresponding to the arrangement of the first dies 120 a and 120 b,respectively. The stacked first/second dies 120 a/140 a and 120 b/140 bform stacked microelectronic devices 150 a and 150 b, respectively. Thewafer 110 can be releasably attached to the temporary carrier 130 (e.g.carrier substrate) using an adhesive layer 132 such as an adhesive film,epoxy, tape, paste, or other suitable material that secures the wafer110 in place during processing. The adhesive 132 should have suitablerelease characteristics for removing the carrier 130 from the wafer 110and/or stacked microelectronic devices 150 following singulation.

In the illustrated embodiment of the assembly 100, the first dies 120are at the active side 112 of the wafer 110. Individual first dies 120can include first integrated circuits 122 (shown schematically) and aplurality of first terminals 124 (e.g. bond pads) electrically coupledto the first integrated circuits 122 and exposed at the active side 112of the wafer 110. In the specific embodiment shown, the first terminals124 are in contact with the adhesive layer 132; however, in otherarrangements, the individual first dies 120 may include a redistributionstructure intermediate the first terminals 124 and the adhesive layer132. The individual first dies 120 further include first through dieinterconnects 125 electrically coupling the first terminals 124 tocorresponding first back side contacts 126. For example, the pluralityof first dies 120 can have a first via 127 that extends through a finalthickness T₁ of the wafer substrate 110 in alignment with at least aportion of the first terminals 124. The first via 127 can then be atleast partially filled with a conductive material, such as copper, toform the first through die interconnect 125. The first interconnects 125can accordingly carry electrical signals and power between the firstterminals 124 and the first contacts 126. In some embodiments, the firstdies 120 can be individually tested before attaching the temporarycarrier 130 to the active side 112 of the wafer 110. From the test, aplurality of known good first dies 120 a and a plurality of known badfirst dies 120 b can be determined and marked for reference.

In the embodiment shown in FIG. 1, the wafer 110 can be thinned to thefinal thickness T₁ through suitable processing steps such as backgrinding, chemical-mechanical planarization, polishing, etc. Removingmaterial from the back side 114 of the wafer 110 can expose the firstback side contacts 126, and etching or other further processing canremove additional material from the back side 114 of the wafer 110 suchthat the exposed contacts 126 project beyond the back side 114 of thewafer 110. In some embodiments, thinning the wafer 110 can result in afinal wafer thickness T₁ of approximately less than 100 microns. Inother embodiments, the wafer thickness T₁ can be approximately less than50 microns, and in further embodiments the wafer 110 can have athickness T₁ of approximately 20 to 150 microns.

In the specific embodiment shown in FIG. 1, the second dies 140 can bethe same as the first dies 120, or the second dies 140 can be differentthan the first dies 120. Individual second dies 140 can include a secondactive side 142, a second back side 144, a second integrated circuit145, and second terminals 146 at the second active side 142 that areelectrically coupled to the second integrated circuit 145. The separatesecond dies 140 can further include a plurality of second through dieinterconnects 147 extending through second vias 149 from the secondterminals 146 at the second active side 142 to second backside contacts148 at the second back side 144.

The plurality of second dies 140 have a final die thickness T₂. Asillustrated, the final die thickness T₂ of the individual second dies140 is uniform. Furthermore, the conductive material of the secondthrough die interconnects 147 extends beyond the thickness T₂ to providestud-shaped second contacts 148 at the second back side 144 of thesecond dies 140. The second die thickness T₂ can be approximately lessthan 100 microns. In other embodiments, however, the final second diethickness T₂ can be approximately less than 50 microns, and in furtherembodiments, the plurality of second dies 140 can have a final thicknessT₂ of approximately 20 to 150 microns.

The second dies 140 are attached to the corresponding first dies 120such that the second terminals 146 are electrically coupled to the firstcontacts 126 at the back side 114 of the wafer 110. Before mounting thesecond dies 140, a soft malleable metal, such as nickel with aluminum,can be plated through under bump metallurgy (UBM) processing to formplated pads 152 at the second active side 142 of the second dies 140.UBM aluminum plated pads 152 can form suitable electrical connectionswith copper and other electrically conductive materials used to form thefirst and second through die interconnects 125, 147. The UBM plated pads152, in conjunction with the stud-shaped first contacts 126, space thesecond dies 140 apart from the back side 114 of the wafer 110 by astand-off height. An underfill material 154 can be disposed between theback side 114 of the wafer 110 and the plurality of stacked second dies140 to fill the stand-off space and provide support for the stackedsecond dies 140.

Before stacking the second dies 140 onto the first dies 120, the seconddies 140 can also be individually tested to determine known good seconddies 140 a and known bad second dies 140 b. As shown in FIG. 1, knowngood second dies 140 a are mounted to corresponding known good firstdies 120 a to form a plurality of known good stacked devices 150 a.Likewise, known bad second dies 140 b are mounted to corresponding knownbad first dies 120 b to form known bad stacked devices 150 b.

The singulated second dies 140 are spaced apart from each other creatinga plurality of gaps 156. In the illustrated embodiment, an encapsulantmaterial 158 (e.g., an epoxy) is disposed in the gaps 156 between thesecond dies 140. The individual stacked microelectronic devices 150 canbe separated from one another by cutting through the encapsulantmaterial 158 in the intervening gaps 156 and through the wafer 110 alonglines A-A. After singulation, known bad stacked devices 150 b can bediscarded.

The embodiment of the stacked devices 150 illustrated in FIG. 1 have anultra-thin profile enabled by the thin final thicknesses T₁ and T₂ ofboth of the individual stacked dies 120 and 140. As previouslydescribed, there is a continuous drive among semiconductor manufacturersto reduce the “footprint” and height of semiconductor components. Inconventional devices, both the first and second dies are fully thinnedto their final thicknesses at the wafer level using temporary carriersfor supplying structural support during back grinding and other thinningtechniques. In conventional devices, the fully thinned second dies areaccordingly singulated and stacked on corresponding first dies at theirfinal thickness. The present inventor recognized that handling thesecond dies after thinning and singulation is challenging because thethinned individual second dies are fragile and subject to breaking.Consequently, conventional second or top dies are not thinned to finalthicknesses less than 300 microns. Following discovery of this problemand the limitations of conventional techniques, the present inventordeveloped new processes for forming stacked die assemblies 100 with topdies substantially less than 300 microns thick.

FIGS. 2A-2F illustrate stages of a specific embodiment of a method formanufacturing semiconductor assemblies 100. FIG. 2A illustrates a stageof the method at which the front side 112 of the wafer 110 is releasablyattached to the temporary carrier 130 by the adhesive layer 132. At thispoint, the wafer 110 has an initial thickness T_(i) between the frontside 112 and the back side 114. The initial thickness T_(i) of the wafer110 can be approximately 500 to 1000 microns (e.g., fully thick beforeany thinning). In other embodiments, the wafer 110 may be partiallythinned before it is attached to the carrier substrate 130 (e.g., T_(i)of approximately 300 to 700 microns). The conductive material for thethrough die interconnects 125 can be embedded within the substrate ofthe wafer 110 at an intermediate depth D₁ at this stage of processing.

FIG. 2B illustrates a stage after the wafer 110 has been thinned fromthe initial thickness T_(i) to the desired thickness T₁. For example,material can be removed from the back side 114 of the wafer 110 using asuitable back grinding process in which the temporary carrier 130 andwafer 110 are mounted in a grinding machine. In the embodiment shown inFIG. 2B, material has been removed from the back side 114 of the wafer110 to at least the intermediate depth D₁ to expose the first back sidecontacts 126 of the first through die interconnects 125. As describedabove with reference to FIG. 1, the thickness T₁ can be less thanapproximately 150 microns, 100 microns, or even less than approximately50 microns. For example, the thickness T₁ can be about 20-150 microns.Further processing, such as etching, can remove additional material fromthe back side 114 of the wafer 110 such that the first contacts 126project beyond the surface of the substrate and have an elevatedstud-shape. In some embodiments, the first contacts 126 can project 5 to10 microns beyond the surface of the back side 114 of the wafer 110.

Referring next to FIG. 2C, a plurality of singulated second dies 140 arestacked on the back side 114 of the wafer 110 and spaced apart from eachother by intervening gaps 156 so that the second dies 140 are arrangedin the die pattern of the first dies 120. At this stage, individualsecond dies 140 have a handling thickness T_(h) between a first side 142(e.g., the second active side 142 of FIG. 1) and a second side 144(e.g., the second back side 144 of FIG. 1) opposite the first side 142.The second dies 140 can be full-thick when attached to the wafer 110;however, in some arrangements, the second dies 140 can be partiallythinned when attached to the wafer 110. For example, the handlingthickness T_(h) can be approximately greater than 300 microns. In otherembodiments the handling thickness T_(h) can be approximately 500 to1000 microns. The handling thickness T_(h) of the second dies 140 isgenerally such that the second contacts 148 of the second through dieinterconnects 147 are located at an intermediate depth D₂ where they arenot exposed on the second side 144 when the second dies 140 are stackedon the first dies 120.

The second dies 140 can be attached to corresponding first dies 120 byplacing the second terminals 146 with overlaying plated pads 152 incontact with corresponding first contacts 126 and using a reflowprocess, or other thermal heating process, to electrically andphysically couple the second dies 140 to corresponding first dies 120.As mentioned previously, the second dies 140 can be individually testedto ensure that known good second dies 140 a are attached to known goodfirst dies 120 a to form known good stacked devices 150 a, and thatknown bad second dies 140 b are attached to known bad first dies 120 bto form known bad stacked devices 150 b.

FIG. 2D illustrates a subsequent stage of the method in which theunderfill material 154 has been dispensed between the thinned wafer 110and the plurality of stacked second dies 140. Referring next to FIG. 2E,the encapsulant material 158 is deposited in the gaps 156 between thestacked second dies 140 to at least partially encapsulate the stackedmicroelectronic devices 150. The encapsulant material 158 can bedeposited in the gaps 156 using a needle-like dispenser, stenciling,molding, a glob-type dispensing process, or other suitable technique.The encapsulant material 158 is generally a polymer or other suitablematerial that protects the stacked devices 150. The encapsulant material158 can fill the gaps 156 to the extent that the encapsulant material158 is generally co-planar or below the second side 144 of the seconddies 140. The upper surface of the encapsulant material 158, however,can project above the second side 144 so long as the encapsulantmaterial 158 does not interfere with subsequent back grinding/thinningprocesses.

FIG. 2F illustrates a stage of the method after the second dies 140 havebeen thinned from the handling thickness T_(h) to the desired thicknessT₂. The semiconductor assembly 100 can be mounted in a grinding machineand the second side 144 of the second dies 140 can be thinnedsimultaneously to the desired thickness T₂ using back grinding,chemical-mechanical planarization, or other suitable processes. Thesecond dies 140 are accordingly thinned after they have been mounted tothe first dies 120. Removing material from the second side 144 of thesecond dies 140 through a back grinding process can yield a uniformthickness T₂ across the plurality of second dies 140, and the underfill154 and the encapsulant material 158 can support and protect the stackedfirst and second dies 120, 140 from downward forces during the grindingprocess.

As shown, the second dies 140 are thinned to at least the depth D₂ toexpose the second contacts 148 of the second through die interconnects147. As described above with reference to FIG. 1, the thickness T₂ canbe less than approximately 150 microns, 100 microns, or in someembodiments less than approximately 50 microns. The thickness T₂, forexample, can be about 20 to 150 microns.

After forming the semiconductor assembly 100, the temporary carrier 130can be removed from the active side 112 of the wafer 110 and the stackedmicroelectronic devices 150 can be separated from each other by cuttingthrough the encapsulant material 158 and through the wafer 110 alonglines A-A. Alternatively, the temporary carrier 130 can also be cutalong lines A-A and be removed from the stacked devices 150 followingseparation of the stacked devices 150. Furthermore, the known badstacked devices 150 b can be discarded following the separation process.

The second contacts 148 can also provide electrical connections foradditional stacked dies such that an additional plurality of dies (notshown) can be mounted on the second dies 140 followed by a simultaneousthinning process as described above. For example, FIG. 3 illustrates aportion of the semiconductor assembly 100 (indicated in broken lines inFIG. 2F) with a third die 302 attached to the second side 144 of thesecond die 140. FIG. 3 shows an enlarged portion of the first throughdie interconnect 125 extending through the wafer 110 to the firstcontact 126 which is bonded to the plated pad 152. Power and signals canthen be routed through the second terminal 146 and the second throughdie interconnect 147 to the second contact 148. The second contact 148can then be bonded to a second plated pad 304 which is electricallyconnected to a third terminal 306 and a third through die interconnect308.

In the illustrated embodiment, the third through die interconnect 308extends from a front side 310 of the third die 302 to a back side 312 ofthe third die 302 and culminates in a third contact 314 on the back side312 of the third die 302. Additional underfill material 316 can bedispersed between the second and third dies 140, 302. Furthermore, thethird die 302 can have an initial thickness (not shown) that can bethinned to a desired thickness T₃ through a back grinding process afterthe third die 302 has been attached to the second die 140. In oneembodiment, the desired thickness T₃ is less than approximately 150microns, 100 microns, or 50 microns. The thickness T₃ can accordingly beabout 20 to 150 microns.

FIG. 4 is a flow chart of an embodiment of a method 400 formanufacturing stacked semiconductor assemblies. The method 400 caninclude mounting a semiconductor wafer to a temporary carrier (block410). The wafer can have a plurality of first dies arranged in a diepattern on the wafer. The method 400 can further include thinning thewafer (block 420). Additionally, the method 400 can include attaching aplurality of singulated second dies to corresponding first dies, whereinthe second dies are arranged in the die pattern and spaced apart fromeach other by gaps (block 430). After attaching the second dies to thefirst dies, the method 400 can further include disposing encapsulatingmaterial in the gaps between the second dies (block 440) and thinningthe second dies (block 450).

FIG. 5 is a flow chart of another embodiment of a method 500 formanufacturing stacked semiconductor assemblies. The method 500 caninclude testing a plurality of first dies to determine known good firstdies and known bad first dies (block 510). The method 500 can alsoinclude testing a plurality of second dies to determine known goodsecond dies and known bad second dies (block 520). Additionally, themethod 500 can include attaching known good second dies to known goodfirst dies to form a plurality of good stacked devices (block 530).Furthermore, the method 500 can include attaching known bad second diesto known bad first dies to form a plurality of bad stacked devices(block 540).

The illustrated embodiment of the stacked first and second dies 120, 140can be thinned to a greater degree than devices manufactured usingconventional die stacking techniques. For example, by stacking thesecond dies 140 onto the first dies 120 while the second dies 140 aresufficiently thick to be handled without breaking, and then subsequentlythinning the second dies 140, both the first and second dies 120, 140can be thinned to less than 300 microns in the final device (e.g.,20-150 microns). Furthermore, in some arrangements, several layers ofdies can be added while at a robust thickness and then be thinned.Because of the extreme thinness of the stacked dies, several layers(e.g. three, four, five, etc.) of dies can be stacked to formmulti-layer stacked microelectronic devices in a low-profile package.

The individual first and second dies 120, 140 can also be tested beforestacking the dies. Defective dies (known bad dies) can be detected andstacked together so that entire defective stacked devices 150 b can bediscarded. Also, by stacking the singulated known bad second dies 140 bonto known bad first dies 120 b, the second known bad dies 140 b cansupport a polishing or grinding pad to enable wafer-level thinning afterstacking the second dies 140 onto the first dies 120. The throughput ofgood stacked devices 150 a can accordingly be increased because theindividual known good dies will only populate other known good dies.

The illustrated embodiments of microelectronic devices 150 also enable awide range of mounting parameters that can be used during themanufacturing process, including a wide variety of suitable underfillmaterials 154. The electrical connections between first contacts 126 andthe plated pads 152 can be enhanced compared to connections made fromstacking pre-thinned second dies. For example, because the handlingthickness T_(h) is large, the second dies 140 are quite strong and canwithstand high down forces when mounting the thick second dies 140 tothe corresponding first dies 120. Moreover, the down forces exertedduring the thinning of the second dies 140 also press the second dies140 against the first dies 120. The high down forces produce betterconnections to avoid undesirable disconnects.

FIG. 6 illustrates a system 600 that includes a stacked semiconductordevice as described above with reference to FIGS. 1-5. Morespecifically, a stacked semiconductor device as described above withreference to FIGS. 1-5 can be incorporated into any of a myriad oflarger and/or more complex systems, and the system 600 is merely arepresentative sample of such as system. The system 600 can include aprocessor 601, a memory 602 (e.g., SRAM, DRAM, flash, or other memorydevices), input/output devices 603, and/or subsystems and othercomponents 604. The stacked semiconductor devices may be included in anyof the components shown in FIG. 6. The resulting system 600 can performany of a wide variety of computing processing, storage, sensing,imaging, and/or other functions. Accordingly, the system 600 can be,without limitation, a computer and/or other data processor, for example,a desktop computer, laptop computer, Internet appliance, hand-helddevice, multi-processor system, processor-based or programmable consumerelectronic, network computer, and/or mini-computer. Suitable hand-helddevices for these systems can include palm-type computers, wearablecomputers, cellular or mobile phones, personal digital assistants, etc.The system 600 can further be a camera, light or other radiation sensor,server and associated server subsystems, and/or any display device. Insuch systems, individual dies can include imager arrays, such as CMOSimagers. Components of the system 600 may be housed in a single unit ordistributed over multiple, interconnected units (e.g., though acommunications network). The components of the system 600 canaccordingly include local and/or remote memory storage devices and anyof a wide variety of computer-readable media.

From the foregoing, it will be appreciated that specific embodiments ofthe invention have been described herein for purposes of illustration,but that various modifications may be made without deviating from thespirit and scope of the invention. For example, specific elements of anyof the foregoing embodiments can be combined or substituted for elementsin other embodiments. Accordingly, the invention is not limited exceptas by the appended claims.

I claim:
 1. A method of manufacturing semiconductor assemblies,comprising: testing first dies of a wafer and individual second dies todetermine known good first dies, known good second dies, known bad firstdies, and known bad second dies; and after testing the first dies andthe second dies, attaching the individual known good second dies to eachof the known good first dies of the wafer to form a plurality of knowngood stacked assemblies, and attaching the individual known bad seconddies to each of the known bad first dies of the wafer to form aplurality of known bad stacked assemblies.
 2. The method of claim 1,further comprising after forming the known good and known bad stackedassemblies, disposing encapsulant material in gaps between the seconddies.
 3. The method of claim 1, further comprising: mounting the waferto a temporary carrier; and thinning the wafer to reduce heights of thefirst dies while the wafer is mounted on the temporary carrier andbefore attaching the second dies to the first dies.
 4. The method ofclaim 3 wherein thinning the wafer includes removing material of thewafer so as to simultaneously expose a plurality of first dieinterconnects at a back side of the wafer that define external contactsfor electrically coupling to contacts of the second dies.
 5. The methodof claim 1, further comprising cutting through the wafer to singulatethe known good and known bad stacked assemblies.
 6. The method of claim1 wherein the individual second dies of the known good and known badstacked assemblies include an integrated circuit and a terminalelectrically coupled to corresponding first dies.
 7. The method of claim1 wherein each first die includes a first terminal, a first integratedcircuit electrically coupled to the first terminal, and a first throughdie interconnect, wherein each second die includes a second terminal, asecond integrated circuit electrically coupled to the second terminal,and a second through die interconnect, and wherein the second terminalis electrically coupled to the first through die interconnect.
 8. Amethod of manufacturing microelectronic devices, comprising: providing awafer with a plurality of first dies that include known good first diesand known bad first dies; and attaching separated second dies to each ofthe first dies to form a plurality of stacked good microelectronicdevices and a plurality of stacked bad microelectronic devices, whereinthe stacked good microelectronic devices include the known good firstdies and known good second dies of the second dies, and wherein thestacked bad microelectronic devices include the known bad first dies andknown bad second dies of the second dies.
 9. The method of claim 8wherein attaching the separated second dies to the first dies includesmounting the known good second dies to the known good first dies of thewafer in a stacked configuration to form the stacked goodmicroelectronic devices; and mounting the known bad second dies to theknown bad first dies of the wafer in a stacked configuration to form thestacked bad microelectronic devices.
 10. The method of claim 8, furthercomprising before attaching the second dies to the first dies, testingthe first dies of the wafer and the second dies to identify the knowngood first dies, the known bad first dies, the known bad second dies,and the known bad second dies.
 11. The method of claim 8, furthercomprising: mounting the wafer to a temporary carrier; and thinning thewafer to remove material from the first dies before attaching the seconddies to the first dies.
 12. The method of claim 11 wherein thinning thewafer includes removing material of the wafer so as to simultaneouslyexpose a plurality of first die interconnects at a back side of thewafer that define external contacts which are subsequently electricallycoupled to the second dies.
 13. The method of claim 11 wherein afterattaching the second dies to the first dies, the known good first diesindividually comprise a first integrated circuit electrically coupled toa first terminal and a first through die interconnect, and wherein theknown good second dies individually comprise a second terminalelectrically coupled to a second integrated circuit, and wherein thesecond terminal is electrically coupled to the first through dieinterconnect such that the first through die interconnect is betweenpositioned between the first terminal and the second terminal.
 14. Themethod of claim 8, further comprising disposing an underfill materialbetween the wafer and the second dies, wherein the underfill materialsurrounds interconnect contacts between the wafer and the second dies;and thinning the second dies by removing material from the second diesand by removing at least some of the underfill material.
 15. The methodof claim 8, further comprising cutting through the wafer to singulatethe stacked good microelectronic devices and the stacked badmicroelectronic devices.
 16. The method of claim 8, further comprisingthinning the second dies after attaching the second dies to the firstdies.
 17. The method of claim 8, after attaching the second dies to thefirst dies, the method further comprising disposing an encapsulatingmaterial between the second dies; and cutting through the encapsulatingmaterial and/or the second dies and through the wafer to singulate thestacked good and stacked bad microelectronic devices.